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9781468477696 - Thermal Stress and Strain in Microelectronics Packaging

Thermal Stress And Strain In Microelectronics Packaging

by John Lau(Author)

Reviews: 5.0
(5 reviews)

Formats

Paperback/English

USD 173.20

Description

Microelectronics packaging and interconnection have experienced exciting growth stimulated by the recognition that systems, not just silicon, provide the solution to evolving applications. In order to have a high density/ performance/yield/quality/reliability, low cost, and light weight system, a more precise understanding of the system behavior is required. Mechanical and thermal phenomena are among the least understood and most complex of the many phenomena encountered in microelectronics pack
ISBN

9781468477696

Publisher

Springer

Publication Date

2012-04-30

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